| Module | Title | LV Type | CP | LV | Dates | Examination |
|---|---|---|---|---|---|---|
| Crystal Growth | Fundamentals and Methods of Crystal Growth | Fach-/Modulprüfung | 8 | 541251 | ||
| Diffraction and Scattering Methods | X-ray and Neutron Scattering in Material Research | Vorlesung/Übung | 537020 | Do 16:30-18:00 IFK 221/222 (6010|221) (×15) | ||
| Electron Microscopy | Mikroanalytisches Praktikum (für Materialwissenschaftler) | Praktikum | 536747 | |||
| Elektronenmikroskopie (für Materialwissenschaftler) | Vorlesung | 536400 | Di 09:00-12:30 AH VI (2356|051) (×1) Fr 08:30-10:00 5054 (2356|054) (×13) | |||
| Elektronenmikroskopie/Mikroanalytisches Praktikum | Fach-/Modulprüfung | 9 | 544625 | |||
| From Physics Principles to the Product | From Physics Principles to the Product | Fach-/Modulprüfung | 2 | 541547 | ||
| From Physics Principles to the Product | From Physics Principles to the Product | Fach-/Modulprüfung | 5 | 541547 | ||
| Nano-Optics I | Nano-Optics I | Fach-/Modulprüfung | 5 | 541203 | ||
| Nano-optics I | Vorlesung/Übung | 536690 | Di 13:00-14:00 MBP2 016 (4273|016) (×12) Di 14:30-16:00 28D 001 (Hörsaal Physik) (4284|101) (×15) Di 16:00-17:00 MBP2 015 (4273|015) (×13) | |||
| Secondary Ion Mass Spectrometry | Sekundärionenmassenspektrometrie SIMS | Vorlesung | 536174 | Mi 08:30-10:00 IPC Hörsaal (2400|U101) (×15) | ||
| Sekundärionen-Massenspektrometrie | Fach-/Modulprüfung | 2 | 545454 | |||
| Single Crystal Methods | Structure Analysis of Complex Mineral and Material Phases | Fach-/Modulprüfung | 3 | 545289 | ||
| Laboratory Course Single Crystal Scattering | Fach-/Modulprüfung | 4 | 544112 | |||
| Laboratory Course Single Crystal Scattering (Short course in February/March 2026 - Old title: Laboratory Course X-ray Scattering) | Praktikum | 537252 | Mo 09:00-17:00 IFK 221/222 (6010|221) (×1) Di 09:00-17:00 IFK 221/222 (6010|221) (×1) Mi 09:00-17:00 IFK 221/222 (6010|221) (×1) Do 09:00-17:00 IFK 221/222 (6010|221) (×1) |